LBO Crystals for Second and Third Harmonic Generation


  • Nonlinear Crystals for Type-I and Non-Critical Phase Matching Second Harmonic Generation and Type-II Sum Frequency Generation
  • Crystal Lengths from 10 to 30 mm
  • Drop-In Compatibility with Nonlinear Crystal Ovens
  • Designed for Use with 1030 or 1064 nm Picosecond and Nanosecond Lasers

An NLCL8 non-critical phase matching crystal is mounted in an NLCH2 oven to maintain its temperature for phase matching.

NLCL1

Mounted LBO Crystal, Type-I SHG, 1064/532 nm, 10 mm Length

NLCL9

Mounted LBO Crystal, NCPM SHG, 1064/532 nm, 30 mm Length

NLCH1

Oven for Nonlinear Crystals up to 15 mm Long

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Key Common Specificationsa
Material Lithium Triborate (LiB3O5)
Crystal Face Dimensions 3.0 mm x 3.0 mm
Clear Aperture >80% of Crystal Face Area
Transmitted Wavefront Error λ/3 @ 632.8 nm Over Clear Aperture
Surface Quality 20-10 Scratch-Dig
Optic Axis Angleb Tolerance <0.5°
  • See the Specs tab for complete specifications.
  • Angle Between Crystal's Surface Normal and Optic Axis
An NLCL8 noncritcal phase matching crystal is shown mounted in an NLCH2 nonlinear crystal oven for temperature control.
Click to Enlarge

Figure 1.1  An NLCL8 non-critical phase matching crystal is shown mounted in an NLCH2 nonlinear crystal oven for temperature control.

Features

  • LBO (LiB3O5) Crystals Optimized for Second Harmonic (SHG) and Sum Frequency (SFG) Generation
    • Type-I SHG: 1030 nm Fundamental / 515 nm SHG or 1064 nm Fundamental / 532 nm SHG
    • Non-Critical Phase Matched (NCPM) SHG: 1064 nm Fundamental / 532 nm SHG
    • Type-II SFG: 1064 nm Fundamental + 532 nm SHG / 355 nm Third Harmonic
  • Appropriate for >0.5 ps pulses
  • Mounted in Customized Holder to Protect Crystal Surfaces
  • Ovens for Nonlinear Crystals Available for Temperature Control (Sold Below)

Thorlabs' Lithium Triborate (LBO) Second Harmonic Generation (SHG) and Sum Frequency Generation (SFG) Crystals for Picosecond and Nanosecond Pulsed Lasers are temperature-tunable to provide efficient SHG and SFG. SHG is a nonlinear process through which two photons with the same wavelength, called the fundamental, are converted into a single SHG photon with half the fundamental wavelength. SFG is a nonlinear process through which two photons with different wavelengths are converted into a single SFG photon with frequency equal to the sum of the frequencies of the two input photons. These uniaxial nonlinear crystals are appropriate for use with nanosecond, picosecond microchip, Nd:YAG, Nd:YLF, and Yb:YAG laser systems.

Pulse parameter information, including recommended minimum pulse durations and focal spot sizes, is provided in the Guidelines tab. Each crystal has an antireflective (AR) coating to provide low reflectance over its fundamental and second harmonic wavelength ranges, as well as the fundamental and sum frequency generated wavelength ranges for Item #s NLCL6 and NLCL7. To support pulsed laser applications, the crystals are offered with a range of length options from 10.00 mm to 30.00 mm that are matched to typical pulse durations and spot sizes, listed in the tables below. When there is not a perfect match between the available crystal length options and an application's laser pulse parameters, we recommend using a crystal whose length is shorter, rather than longer, than optimal. See the Specs tab for complete specifications for the nonlinear crystals listed below.

The crystals are each mounted in housings that are 21.0 mm wide and 10.8 mm tall, with varying lengths depending on the length of the crystal, and a clear aperture through the crystal of 2.7 mm x 2.7 mm. For type-I and NCPM SHG operation, the incident light at the fundamental wavelength should be vertically polarized and the SHG light should be horizontally polarized, as shown in Figure 1.2. For type-II SFG, the 355 nm light will have the same polarization direction as the fundamental. Under phase matched conditions, the efficiency of the SHG and SFG processes are improved, enabling the intensity of the SHG and SFG light to increase exponentially with propagation distance through the crystal. Phase matching in combination with suitable excitation intensities (>50 MW/cm2) typically provides >10% conversion efficiencies for these crystals.

To separate the second and third harmonics from the fundamental in the output from the crystal, we recommend using a harmonic beamsplitter, as seen in the schematics in the SHG and SFG Experimental Setups tab.

LBO Crystal Polarization Orientations
Click to Enlarge

Figure 1.2  The polarization axes for our mounted LBO nonlinear crystals are shown above a photo of the NLCL1 crystal. For the NLCL6 and NLCL7 SFG crystals, the orientation of the 355 nm output will be orthogonal to the 532 nm SHG.

Alignment for Optimal SHG
To optimize the SHG process in LBO, type-I and type-II phase matching can be achieved by aligning the polarization of the fundamental input light parallel to one of the crystal's principal ordinary axes, and then adjusting the angle between the optic axis and propagation direction, marked θ in Figure 1.2, so that both the fundamental and second harmonic light experience the same index of refraction (see the SHG Tutorial tab for a description of this process). For each of the type-I and type-II crystals below, the angle between the optic axis and the normal to the crystal surface, θ, was chosen so that phase matching would be optimized for normally incident light at the fundamental wavelength listed in the tables below. There will generally still be some small angular adjustment required for optimal phase matching. For information on how the optimal angle for phase matching can be tuned for different fundamental wavelengths, see the Guidelines tab.

Type-I vs. NCPM Acceptance AngleClick to Enlarge
Click Here for Raw Data
Figure 1.3  Type-I nonlinear crystals need to be carefully aligned; deviation of the incident beam angle by a fraction of a degree will substantially decrease the SHG efficiency. NCPM crystals are able to better maintain their efficiency despite slight angular deviation, avoiding tedious angle tuning.

Due to the substantial length of these crystals, temperature plays a significant role in the SHG and SFG efficiency and the alignment. We offer ovens (sold below) that are designed for simple drop-in compatibility with these mounted LBO crystals (see Figure 1.1) in order to hold the temperature of the crystals constant for consistent and efficient harmonic conversion. Our NCPM crystals (Item #s NLCL8 and NLCL9) are optimized for SHG at 150 °C and therefore require an oven for use; for more information on the temperature dependence of phase matching, please see the SHG Tutorial tab. The rest of our LBO crystals are designed to be used at room temperature, but will have inconsistent SHG and SFG efficiency if the temperature is not held stable. Our ovens can also be used to provide stability for the room temperature crystals; please see the Guidelines tab for more information on the temperature dependence of all of our LBO crystals.

Non-Critical Phase Matching
Non-critical phase matching (NCPM) is the method by which the SHG is tuned in our NLCL8 and NLCL9 NCPM LBO crystals and refers to the case where crystals are cut such that the fundamental and SHG polarizations are parallel to the principal axes. To achieve phase matching, the temperature of the crystal is used to tune the phase velocity of the two principal axes, rather than tuning the optic axis angle as is done in type-I and type-II phase matching. A consequence of reducing the dependence of phase matching to just the principal axes is to greatly increase the angular acceptance (or conversely decrease the angular sensitivity) of the phase matching process, as shown in Figure 1.3. This makes optically aligning these crystals straightforward and allows for independent tuning via crystal temperature. Another benefit of both the fundamental and SHG light propagating along the principal axes is the elimination of Poynting vector walk-off through the crystal. For more information on the benefits of NCPM, please see the SHG Tutorial tab.

Usage, Handling, and Care
When handling the crystals, use care and always wear gloves. These crystals scratch easily, and the material is hygroscopic. Protect the crystals from excess moisture such as high humidity environments. If needed, we recommend gently puffing with clean dry air only, as detailed in the Blowing Off the Surface of an Optic section in our Optics Handling and Care Tutorial.

General Specifications
Item # NLCL4 NLCL5 NLCL1 NLCL2 NLCL3 NLCL8 NLCL9 NLCL6 NLCL7
Application Type-I SHG Type-I SHG Non-Critical Phase Matched SHG Type-II SFG
Fundamental Wavelength (1ω) 1030 nm 1064 nm 1064 nm -
SHG Wavelength (2ω) 515 nm 532 nm 532 nm -
SFG Wavelength (1ω + 2ω = 3ω)  - - - 1064 nm + 532 nm : 355 nm
Crystal Length 10.00 mm 20.00 mm 10.00 mm 15.00 mm 20.00 mm 20.00 mm 30.00 mm 10.00 mm 15.00 mm
Crystal Length Tolerance ±0.05 mm ±0.05 mm ±0.05 mm ±0.05 mm
Angle of Optic Axis (θ, Φ)a 90°, 13.6° 90°, 11.4° 90°, 0° 42.4°, 90°
Optic Axis Angle (θ, Φ)a Tolerance <0.5° <0.5° <0.5° <0.5°
AR Coating
(AOI = 0°)
R < 0.25% at 1030 nm and 515 nm R < 0.25% at 1064 nm and 532 nm R < 0.25% at 1064 nm and 532 nm R < 0.5% at 1064 nm, 532 nm,
and 355 nm
AR Coating Curveb Icon
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Laser Induced Damage Thresholdc >25 J/cm2 (1064 nm, 10 ns, 100 Hz, Ø220 μm) >25 J/cm2 (1064 nm, 10 ns, 100 Hz, Ø220 μm) >25 J/cm2 (1064 nm, 10 ns, 100 Hz, Ø220 μm) >5 J/cm2 (532 nm, 5.5 ns, 100 Hz, Ø220 μm)
Crystal Face Dimensions
3.0 mm x 3.0 mm
Crystal Face Dimensional Tolerance ±0.1 mm
Clear Aperture >80% of Crystal Face Area
Surface Quality 20-10 Scratch-Dig
Transmitted Wavefront Error λ/3 @ 632.8 nm Over Clear Aperture
  • Angle Between Crystal's Surface Normal and Optic Axis
  • All data are theoretical unless otherwise noted.
  • For ultrafast optics, the laser induced damage threshold (LIDT) is defined as the fluence (per pulse) that produces visible damage after a given number of pulses. LIDT values are not guaranteed in the ultrashort pulse regime. As such, they are provided as a service to customers.

Physical and Optical Properties
Material Lithium Triborate (LiB3O5)
Crystal Structure Negative Biaxial, Orthorhombic mm2
Transparency Range 160 - 2600 nm
Second-Order Nonlinear Coefficientsa d31 = 0.85 pm/V
d32 = -0.67 pm/V
d33 = 0.04 pm/V
Nonlinear Refractive Index (Kerr Index)b 2.6 x 10−20 m2/W @ 780 nm
Sellmeier Coefficientsc Sellmeier LBO
Sellmeier LBO
Sellmeier LBO
Temperature Dependent Changes in the Indexc Index Temp Dependence LBO
Index Temp Dependence LBO
Index Temp Dependence LBO
Thermal Conductivityd kx = 2.7 W / m ⋅ K
ky = 3.1 W / m ⋅ K
kz = 4.5 W / m ⋅ K
Mohs Hardness 6 Mohs
Density 2.474 g/cm3

The values in this table are guidelines for optimal performance of the nonlinear crystals.

Implementation Guidelines
Item # NLCL4 NLCL5 NLCL1 NLCL2 NLCL3 NLCL8 NLCL9 NLCL6 NLCL7
Application Type-I SHG Type-I SHG Non-Critical Phase Matched SHG Type-II SFG
Fundamental Wavelength (1ω) 1030 nm 1064 nm 1064 nm -
SHG Wavelength (2ω) 515 nm 532 nm 532 nm -
SFG Wavelength (1ω + 2ω = 3ω)  - - - 1064 nm + 532 nm : 355 nm
Recommended Operating Temperature <60 °C <60 °C 150 °C <60 °C
Temperature Stabilitya ±2.6 °C ±1.4 °C ±2.6 °C ±1.8 °C ±1.4 °C ±1.0 °C ±0.8 °C ±1.4 °C ±1.0 °C
SHG Efficiency vs. Temperatureb,c Icon
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AOI vs. Temperatureb,c Icon
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AOI vs. Wavelengthb,d Icon
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Temperature vs. Wavelengthb,c,d - - Icon
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Minimum Recommended Focal Spot Size (1/e2 Diameter)e 200 µmf 400 µmf 175 µmf 260 µmf 350 µmf 69 µmg 85 µmg 221 µmf,h 330 µmf,h
Circularity vs. Fundamental Mode Field Diameter (MFD)b,e Icon
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Minimum Recommended Pulse Duration (FWHM)e 0.50 ps 1.00 ps 0.42 ps 0.65 ps 0.88 ps 0.88 ps 1.30 ps 2.05 ps 3.10 ps
Phase Matching Bandwidth (FWHM)e 3.0 nm 1.5 nm 3.8 nm 2.5 nm 1.9 nm 1.9 nm 1.3 nm 0.8 nm 0.5 nm
  • For SHG and SFG, temperature fluctuations (for any temperature within the operating range) that are greater than these will result in a ≥10% drop in harmonic generation efficiency.
  • All data are theoretical unless otherwise noted.
  • To improve the environmental temperature sensitivity of the phase matching process, a heater such as Thorlabs' NLCH1(/M) or NLCH2(/M) ovens can be used to elevate the crystal temperature above ambient temperature which in turn requires some angular adjustment away from zero degrees AOI to achieve phase matching. At around zero degrees AOI, our critically phase matched LBO crystals (Item #s NLCL1, NLCL2, NLCL3, NLCL4, NLCL5, NLCL6, and NLCL7) demonstrate peak SHG efficiency at around 20 °C, while our NCPM crystals are optimized for SHG around 150 °C.
  • Our type-I and type-II crystals can achieve phase matching by tuning the external angle of incidence of the pump laser, while our NCPM crystals (Item #s NLCL8 and NLCL9) are easily tuned by controlling the crystal temperature with our NLCH2(/M) oven.
  • Assumes incident light with fundamental wavelength 1030 nm (Item #s NLCL4, and NLCL5) or 1064 nm (Item #s NLCL1, NLCL2, NLCL3, NLCL8, NLCL9, NLCL6, and NLCL7). For the 532 nm input for the SFG crystals, these are the recommendations for the characteristics of the 1064 nm beam incident on one of our SHG crystals to produce the additional 532 nm input beam.
  • The recommended minimum focal spot size is larger than the Boyd and Kleinman optimum ratio to preserve SHG circularity as determined through numerical analysis. The SHG Output becomes increasingly elliptical below this recommendation.
  • The recommended minimum focal spot size is determined by the optimal focusing condition for SHG as calculated using the Boyd and Kleinman ratio of L/b = 2.84, where L is the optical path length in the crystal and b is the confocal parameter of the Gaussian beam. For more information, please see G.D. Boyd and D.A. Kleinman, "Parametric Interaction of Focused Gaussian Light Beams," Journal of Applied Physics 39, 3597 - 3639 (1968).
  • The recommended minimum focal spot sizes for the 532 nm input light in Item #s NLCL6 and NLCL7 are 1/√2 times the recommended spot sizes at 1064 nm. This spot size will naturally result from the matched confocal parameter in the SHG from a crystal producing the 532 nm input, meaning that the beams do not need to be separated before entering the SFG crystal, as shown in Figure 4.2 in the SHG and SFG Experimental Setups tab. For more information, please see G.D. Boyd and D.A. Kleinman, "Parametric Interaction of Focused Gaussian Light Beams," Journal of Applied Physics 39, 3597 - 3639 (1968).

Second Harmonic Generation Experimental Setup

Second Harmonic Generation Setup
Figure 4.1  A schematic is shown of a setup used to frequency double the 1064 nm output of a QSL106B picosecond laser by passing through an NLCL8 noncritcal phase matching crystal mounted in an NLCH2 nonlinear crystal oven held at 150 °C. We recommend mounting the oven on a PY005(/M) 5-axis stage for full alignment control. The beam is collimated and focused to the optimal MFD in the crystal using the LA1509-B-ML and LA1484-B-ML lenses, respectively, and is linearly polarized using the WPQ10ME-1064 quarter- and WPH10ME-1064 half-wave plates. Output SHG light is reflected by the UBS24 dichroic beamsplitter while the fundamental wavelength passes through to a beam block. Remaining traces of the fundamental wavelength are then filtered out of the reflected beam via an FESH0800 shortpass filter.

Sum Frequency Generation Experimental Setup

Second Harmonic Generation Setup
Figure 4.2  A schematic is shown of a setup used to generate 355 nm sum frequency light from the 1064 nm output of a QSL106B picosecond laser by passing through an NLCL8 non-critcal phase matching crystal mounted in an NLCH2 nonlinear crystal oven held at 150 °C and an NLCL6 type-II SFG crystal in an NLCH1 nonlinear crystal oven held at 20 °C. We recommend mounting each oven on a PY005(/M) 5-axis stage for full alignment control. The beam is collimated and focused to the optimal MFD in between the crystals using the LA1509-B-ML and LA1484-B-ML lenses, respectively, and is linearly polarized using the WPQ10ME-1064 quarter- and WPH10ME-1064 half-wave plates. The 532 nm SHG light generated by the first crystal is incident on the second crystal along with the 1064 nm fundamental light, which together produce the sum frequency 355 nm light. The 355 nm light is reflected by the HBSY13 dichroic beamsplitter while the fundamental and SHG wavelengths pass through to a beam stop. Remaining traces of the fundamental and SHG wavelengths are then filtered out of the reflected beam via a second HBSY13 beamsplitter before the filtered sum frequency generated light is detected by the S401C optical power sensor.

Second Harmonic and Sum Frequency Generation and Phase Matching

Optimizing the intensity and beam quality of the second harmonic and sum frequency light provided by our nonlinear crystals requires choosing the crystal length appropriate to the duration of the input laser pulses, determining a focal spot size that balances the positive and negative effects of the focal region, and optimizing the phase matching conditions. Succinct guidance on each of these topics is provided by the graphs available on the Guidelines tab. Additional information and background, which can be helpful for interpreting the graphed data as well as more effectively using the crystals to generate second harmonic and sum frequency light, is included in the expandable sections below. Second harmonic generation (SHG) is a subset of sum frequency generation (SFG); this tutorial focuses on the specific case of SHG but will touch on SFG and the relevant distinctions.

Click on a question to expand the corresponding passage that provides an answer, and then click again to contract the section. Answers to questions lower in the list reference the discussions in preceding sections.

Table 6.1  Damage Threshold Specificationsa
Item # Damage Threshold
NLCL4 >25 J/cm2 (1064 nm, 10 ns, 100 Hz, Ø220 μm)
NLCL5
NLCL1
NLCL2
NLCL3
NLCL8
NLCL9
NLCL6 >5 J/cm2 (532 nm, 5.5 ns, 100 Hz, Ø220 μm)
NLCL7
  • For ultrafast optics, the laser induced damage threshold (LIDT) is defined as the fluence (per pulse) that produces visible damage after a given number of pulses. LIDT values are not guaranteed in the ultrashort pulse regime. As such, they are provided as a service to customers.

Damage Threshold Data for Thorlabs' LBO Crystals

The specifications in Table 6.1 are measured data for Thorlabs' LBO Crystals for Second Harmonic and Sum Frequency Generation.

 

Laser Induced Damage Threshold Tutorial

The following is a general overview of how laser induced damage thresholds are measured and how the values may be utilized in determining the appropriateness of an optic for a given application. When choosing optics, it is important to understand the Laser Induced Damage Threshold (LIDT) of the optics being used. The LIDT for an optic greatly depends on the type of laser you are using. Continuous wave (CW) lasers typically cause damage from thermal effects (absorption either in the coating or in the substrate). Pulsed lasers, on the other hand, often strip electrons from the lattice structure of an optic before causing thermal damage. Note that the guideline presented here assumes room temperature operation and optics in new condition (i.e., within scratch-dig spec, surface free of contamination, etc.). Because dust or other particles on the surface of an optic can cause damage at lower thresholds, we recommend keeping surfaces clean and free of debris. For more information on cleaning optics, please see our Optics Cleaning tutorial.

Testing Method

Thorlabs' LIDT testing is done in compliance with ISO/DIS 11254 and ISO 21254 specifications.

First, a low-power/energy beam is directed to the optic under test. The optic is exposed in 10 locations to this laser beam for 30 seconds (CW) or for a number of pulses (pulse repetition frequency specified). After exposure, the optic is examined by a microscope (~100X magnification) for any visible damage. The number of locations that are damaged at a particular power/energy level is recorded. Next, the power/energy is either increased or decreased and the optic is exposed at 10 new locations. This process is repeated until damage is observed. The damage threshold is then assigned to be the highest power/energy that the optic can withstand without causing damage. A histogram such as that below represents the testing of one BB1-E02 mirror.

LIDT metallic mirror
The photograph above is a protected aluminum-coated mirror after LIDT testing. In this particular test, it handled 0.43 J/cm2 (1064 nm, 10 ns pulse, 10 Hz, Ø1.000 mm) before damage.
LIDT BB1-E02
Example Test Data
Fluence # of Tested Locations Locations with Damage Locations Without Damage
1.50 J/cm2 10 0 10
1.75 J/cm2 10 0 10
2.00 J/cm2 10 0 10
2.25 J/cm2 10 1 9
3.00 J/cm2 10 1 9
5.00 J/cm2 10 9 1

According to the test, the damage threshold of the mirror was 2.00 J/cm2 (532 nm, 10 ns pulse, 10 Hz, Ø0.803 mm). Please keep in mind that these tests are performed on clean optics, as dirt and contamination can significantly lower the damage threshold of a component. While the test results are only representative of one coating run, Thorlabs specifies damage threshold values that account for coating variances.

Continuous Wave and Long-Pulse Lasers

When an optic is damaged by a continuous wave (CW) laser, it is usually due to the melting of the surface as a result of absorbing the laser's energy or damage to the optical coating (antireflection) [1]. Pulsed lasers with pulse lengths longer than 1 µs can be treated as CW lasers for LIDT discussions.

When pulse lengths are between 1 ns and 1 µs, laser-induced damage can occur either because of absorption or a dielectric breakdown (therefore, a user must check both CW and pulsed LIDT). Absorption is either due to an intrinsic property of the optic or due to surface irregularities; thus LIDT values are only valid for optics meeting or exceeding the surface quality specifications given by a manufacturer. While many optics can handle high power CW lasers, cemented (e.g., achromatic doublets) or highly absorptive (e.g., ND filters) optics tend to have lower CW damage thresholds. These lower thresholds are due to absorption or scattering in the cement or metal coating.

Linear Power Density Scaling

LIDT in linear power density vs. pulse length and spot size. For long pulses to CW, linear power density becomes a constant with spot size. This graph was obtained from [1].

Intensity Distribution

Pulsed lasers with high pulse repetition frequencies (PRF) may behave similarly to CW beams. Unfortunately, this is highly dependent on factors such as absorption and thermal diffusivity, so there is no reliable method for determining when a high PRF laser will damage an optic due to thermal effects. For beams with a high PRF both the average and peak powers must be compared to the equivalent CW power. Additionally, for highly transparent materials, there is little to no drop in the LIDT with increasing PRF.

In order to use the specified CW damage threshold of an optic, it is necessary to know the following:

  1. Wavelength of your laser
  2. Beam diameter of your beam (1/e2)
  3. Approximate intensity profile of your beam (e.g., Gaussian)
  4. Linear power density of your beam (total power divided by 1/e2 beam diameter)

Thorlabs expresses LIDT for CW lasers as a linear power density measured in W/cm. In this regime, the LIDT given as a linear power density can be applied to any beam diameter; one does not need to compute an adjusted LIDT to adjust for changes in spot size, as demonstrated by the graph to the right. Average linear power density can be calculated using the equation below. 

The calculation above assumes a uniform beam intensity profile. You must now consider hotspots in the beam or other non-uniform intensity profiles and roughly calculate a maximum power density. For reference, a Gaussian beam typically has a maximum power density that is twice that of the uniform beam (see lower right).

Now compare the maximum power density to that which is specified as the LIDT for the optic. If the optic was tested at a wavelength other than your operating wavelength, the damage threshold must be scaled appropriately. A good rule of thumb is that the damage threshold has a linear relationship with wavelength such that as you move to shorter wavelengths, the damage threshold decreases (i.e., a LIDT of 10 W/cm at 1310 nm scales to 5 W/cm at 655 nm):

CW Wavelength Scaling

While this rule of thumb provides a general trend, it is not a quantitative analysis of LIDT vs wavelength. In CW applications, for instance, damage scales more strongly with absorption in the coating and substrate, which does not necessarily scale well with wavelength. While the above procedure provides a good rule of thumb for LIDT values, please contact Tech Support if your wavelength is different from the specified LIDT wavelength. If your power density is less than the adjusted LIDT of the optic, then the optic should work for your application. 

Please note that we have a buffer built in between the specified damage thresholds online and the tests which we have done, which accommodates variation between batches. Upon request, we can provide individual test information and a testing certificate. The damage analysis will be carried out on a similar optic (customer's optic will not be damaged). Testing may result in additional costs or lead times. Contact Tech Support for more information.

Pulsed Lasers

As previously stated, pulsed lasers typically induce a different type of damage to the optic than CW lasers. Pulsed lasers often do not heat the optic enough to damage it; instead, pulsed lasers produce strong electric fields capable of inducing dielectric breakdown in the material. Unfortunately, it can be very difficult to compare the LIDT specification of an optic to your laser. There are multiple regimes in which a pulsed laser can damage an optic and this is based on the laser's pulse length. The highlighted columns in the table below outline the relevant pulse lengths for our specified LIDT values.

Pulses shorter than 10-9 s cannot be compared to our specified LIDT values with much reliability. In this ultra-short-pulse regime various mechanics, such as multiphoton-avalanche ionization, take over as the predominate damage mechanism [2]. In contrast, pulses between 10-7 s and 10-4 s may cause damage to an optic either because of dielectric breakdown or thermal effects. This means that both CW and pulsed damage thresholds must be compared to the laser beam to determine whether the optic is suitable for your application.

Pulse Duration t < 10-9 s 10-9 < t < 10-7 s 10-7 < t < 10-4 s t > 10-4 s
Damage Mechanism Avalanche Ionization Dielectric Breakdown Dielectric Breakdown or Thermal Thermal
Relevant Damage Specification No Comparison (See Above) Pulsed Pulsed and CW CW

When comparing an LIDT specified for a pulsed laser to your laser, it is essential to know the following:

Energy Density Scaling

LIDT in energy density vs. pulse length and spot size. For short pulses, energy density becomes a constant with spot size. This graph was obtained from [1].

  1. Wavelength of your laser
  2. Energy density of your beam (total energy divided by 1/e2 area)
  3. Pulse length of your laser
  4. Pulse repetition frequency (prf) of your laser
  5. Beam diameter of your laser (1/e2 )
  6. Approximate intensity profile of your beam (e.g., Gaussian)

The energy density of your beam should be calculated in terms of J/cm2. The graph to the right shows why expressing the LIDT as an energy density provides the best metric for short pulse sources. In this regime, the LIDT given as an energy density can be applied to any beam diameter; one does not need to compute an adjusted LIDT to adjust for changes in spot size. This calculation assumes a uniform beam intensity profile. You must now adjust this energy density to account for hotspots or other nonuniform intensity profiles and roughly calculate a maximum energy density. For reference a Gaussian beam typically has a maximum energy density that is twice that of the 1/e2 beam.

Now compare the maximum energy density to that which is specified as the LIDT for the optic. If the optic was tested at a wavelength other than your operating wavelength, the damage threshold must be scaled appropriately [3]. A good rule of thumb is that the damage threshold has an inverse square root relationship with wavelength such that as you move to shorter wavelengths, the damage threshold decreases (i.e., a LIDT of 1 J/cm2 at 1064 nm scales to 0.7 J/cm2 at 532 nm):

Pulse Wavelength Scaling

You now have a wavelength-adjusted energy density, which you will use in the following step.

Beam diameter is also important to know when comparing damage thresholds. While the LIDT, when expressed in units of J/cm², scales independently of spot size; large beam sizes are more likely to illuminate a larger number of defects which can lead to greater variances in the LIDT [4]. For data presented here, a <1 mm beam size was used to measure the LIDT. For beams sizes greater than 5 mm, the LIDT (J/cm2) will not scale independently of beam diameter due to the larger size beam exposing more defects.

The pulse length must now be compensated for. The longer the pulse duration, the more energy the optic can handle. For pulse widths between 1 - 100 ns, an approximation is as follows:

Pulse Length Scaling

Use this formula to calculate the Adjusted LIDT for an optic based on your pulse length. If your maximum energy density is less than this adjusted LIDT maximum energy density, then the optic should be suitable for your application. Keep in mind that this calculation is only used for pulses between 10-9 s and 10-7 s. For pulses between 10-7 s and 10-4 s, the CW LIDT must also be checked before deeming the optic appropriate for your application.

Please note that we have a buffer built in between the specified damage thresholds online and the tests which we have done, which accommodates variation between batches. Upon request, we can provide individual test information and a testing certificate. Contact Tech Support for more information.


[1] R. M. Wood, Optics and Laser Tech. 29, 517 (1998).
[2] Roger M. Wood, Laser-Induced Damage of Optical Materials (Institute of Physics Publishing, Philadelphia, PA, 2003).
[3] C. W. Carr et al., Phys. Rev. Lett. 91, 127402 (2003).
[4] N. Bloembergen, Appl. Opt. 12, 661 (1973).

In order to illustrate the process of determining whether a given laser system will damage an optic, a number of example calculations of laser induced damage threshold are given below. For assistance with performing similar calculations, we provide a spreadsheet calculator that can be downloaded by clicking the LIDT Calculator button. To use the calculator, enter the specified LIDT value of the optic under consideration and the relevant parameters of your laser system in the green boxes. The spreadsheet will then calculate a linear power density for CW and pulsed systems, as well as an energy density value for pulsed systems. These values are used to calculate adjusted, scaled LIDT values for the optics based on accepted scaling laws. This calculator assumes a Gaussian beam profile, so a correction factor must be introduced for other beam shapes (uniform, etc.). The LIDT scaling laws are determined from empirical relationships; their accuracy is not guaranteed. Remember that absorption by optics or coatings can significantly reduce LIDT in some spectral regions. These LIDT values are not valid for ultrashort pulses less than one nanosecond in duration.

Intensity Distribution
Figure 71A  A Gaussian beam profile has about twice the maximum intensity of a uniform beam profile.

CW Laser Example
Suppose that a CW laser system at 1319 nm produces a 0.5 W Gaussian beam that has a 1/e2 diameter of 10 mm. A naive calculation of the average linear power density of this beam would yield a value of 0.5 W/cm, given by the total power divided by the beam diameter:

CW Wavelength Scaling

However, the maximum power density of a Gaussian beam is about twice the maximum power density of a uniform beam, as shown in Figure 71A. Therefore, a more accurate determination of the maximum linear power density of the system is 1 W/cm.

An AC127-030-C achromatic doublet lens has a specified CW LIDT of 350 W/cm, as tested at 1550 nm. CW damage threshold values typically scale directly with the wavelength of the laser source, so this yields an adjusted LIDT value:

CW Wavelength Scaling

The adjusted LIDT value of 350 W/cm x (1319 nm / 1550 nm) = 298 W/cm is significantly higher than the calculated maximum linear power density of the laser system, so it would be safe to use this doublet lens for this application.

Pulsed Nanosecond Laser Example: Scaling for Different Pulse Durations
Suppose that a pulsed Nd:YAG laser system is frequency tripled to produce a 10 Hz output, consisting of 2 ns output pulses at 355 nm, each with 1 J of energy, in a Gaussian beam with a 1.9 cm beam diameter (1/e2). The average energy density of each pulse is found by dividing the pulse energy by the beam area:

Pulse Energy Density

As described above, the maximum energy density of a Gaussian beam is about twice the average energy density. So, the maximum energy density of this beam is ~0.7 J/cm2.

The energy density of the beam can be compared to the LIDT values of 1 J/cm2 and 3.5 J/cm2 for a BB1-E01 broadband dielectric mirror and an NB1-K08 Nd:YAG laser line mirror, respectively. Both of these LIDT values, while measured at 355 nm, were determined with a 10 ns pulsed laser at 10 Hz. Therefore, an adjustment must be applied for the shorter pulse duration of the system under consideration. As described on the previous tab, LIDT values in the nanosecond pulse regime scale with the square root of the laser pulse duration:

Pulse Length Scaling

This adjustment factor results in LIDT values of 0.45 J/cm2 for the BB1-E01 broadband mirror and 1.6 J/cm2 for the Nd:YAG laser line mirror, which are to be compared with the 0.7 J/cm2 maximum energy density of the beam. While the broadband mirror would likely be damaged by the laser, the more specialized laser line mirror is appropriate for use with this system.

Pulsed Nanosecond Laser Example: Scaling for Different Wavelengths
Suppose that a pulsed laser system emits 10 ns pulses at 2.5 Hz, each with 100 mJ of energy at 1064 nm in a 16 mm diameter beam (1/e2) that must be attenuated with a neutral density filter. For a Gaussian output, these specifications result in a maximum energy density of 0.1 J/cm2. The damage threshold of an NDUV10A Ø25 mm, OD 1.0, reflective neutral density filter is 0.05 J/cm2 for 10 ns pulses at 355 nm, while the damage threshold of the similar NE10A absorptive filter is 10 J/cm2 for 10 ns pulses at 532 nm. As described on the previous tab, the LIDT value of an optic scales with the square root of the wavelength in the nanosecond pulse regime:

Pulse Wavelength Scaling

This scaling gives adjusted LIDT values of 0.08 J/cm2 for the reflective filter and 14 J/cm2 for the absorptive filter. In this case, the absorptive filter is the best choice in order to avoid optical damage.

Pulsed Microsecond Laser Example
Consider a laser system that produces 1 µs pulses, each containing 150 µJ of energy at a repetition rate of 50 kHz, resulting in a relatively high duty cycle of 5%. This system falls somewhere between the regimes of CW and pulsed laser induced damage, and could potentially damage an optic by mechanisms associated with either regime. As a result, both CW and pulsed LIDT values must be compared to the properties of the laser system to ensure safe operation.

If this relatively long-pulse laser emits a Gaussian 12.7 mm diameter beam (1/e2) at 980 nm, then the resulting output has a linear power density of 5.9 W/cm and an energy density of 1.2 x 10-4 J/cm2 per pulse. This can be compared to the LIDT values for a WPQ10E-980 polymer zero-order quarter-wave plate, which are 5 W/cm for CW radiation at 810 nm and 5 J/cm2 for a 10 ns pulse at 810 nm. As before, the CW LIDT of the optic scales linearly with the laser wavelength, resulting in an adjusted CW value of 6 W/cm at 980 nm. On the other hand, the pulsed LIDT scales with the square root of the laser wavelength and the square root of the pulse duration, resulting in an adjusted value of 55 J/cm2 for a 1 µs pulse at 980 nm. The pulsed LIDT of the optic is significantly greater than the energy density of the laser pulse, so individual pulses will not damage the wave plate. However, the large average linear power density of the laser system may cause thermal damage to the optic, much like a high-power CW beam.


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LBO Crystals for Type-I SHG: 1030 nm Fundamental, 515 nm SHG

Key Specificationsa
Item # NLCL4 NLCL5
Crystal Length 10.00 mm 20.00 mm
Angle of Optic Axis (θ, Φ)b 90°, 13.6°
Application Type-I SHG
AR Coating (AOI = 0°)c R < 0.25% at 1030 nm and 515 nm
Fundamental Wavelength (1ω) 1030 nm
SHG Wavelength (2ω) 515 nm
  • See the Specs tab for complete specifications.
  • Angle Between Crystal's Surface Normal and Optic Axis
  • See the Specs tab for performance graphs.
Implementation Guidelinesa
Item # NLCL4 NLCL5
Recommended Operating Temperature <60 °C
Temperature Stabilityb ±2.6 °C ±1.4 °C
Minimum Recommended Focal Spot Size (1/e2 Diameter)c,d 200 µm 400 µm
Minimum Recommended Pulse Duration (FWHM)c 0.50 ps 1.00 ps
Phase Matching Bandwidth (FWHM)c 3.0 nm 1.5 nm
Recommended Oven (Optional)e NLCH1(/M) or NLCH2(/M) NLCH2(/M)
  • See the Guidelines tab for complete recommendations and theoretical performance data.
  • For SHG, temperature fluctuations greater than these will result in a ≥10% drop in harmonic generation efficiency.
  • Assumes incident light with a wavelength of 1030 nm.
  • The recommended minimum focal spot size is larger than the Boyd and Kleinman optimum ratio to preserve SHG circularity as determined through numerical analysis. The SHG Output becomes increasingly elliptical below this recommendation.
  • Sold separately below. While an oven for temperature control is not required for operation, it is recommended for SHG output stability. Please see the Guidelines tab for more information.
  • Mounted LBO Crystal with AR Coating for 515 nm and 1030 nm
  • Designed for Type-I SHG with 1030 nm Nanosecond, Picosecond, Nd:YAG, Nd:YLF, and Yb:YAG Lasers
  • Optional Crystal Oven for Temperature Stability Available Below (Sold Separately)

These LBO crystals are designed to produce type-I SHG emission at 515 nm from an input beam with a center wavelength of 1030 nm. They are available with lengths of 10.00 or 20.00 mm and feature an AR coating to reduce surface reflections at the fundamental and second harmonic wavelengths. The crystals are mounted in housings that are 21.0 mm wide, 10.8 mm tall, and 11.0 mm (Item # NLCL4) or 21.0 mm (Item # NLCL5) long, with a clear aperture of 2.7 mm x 2.7 mm. These mounted crystals can be used to frequency double the output of 1030 nm nanosecond and picosecond lasers such as Item # QSL103A. Please see the SHG and SFG Experimental Setups tab for an example of an SHG experimental setup.

Due to the LBO crystal length, the efficiency of SHG is highly sensitive to temperature and temperature fluctuations (please see the SHG Tutorial tab for more information). At a 0° angle of incidence, these crystals demonstrate peak SHG efficiency at around 20° C. To stabilize the SHG output, Thorlabs recommends using our Ovens for Nonlinear Crystals (sold separately below) for heating and temperature control. Please see the Guidelines tab for more information on the temperature requirements for the NLCL4 and NLCL5 LBO crystals.

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LBO Crystals for Type-I SHG: 1064 nm Fundamental, 532 nm SHG

Key Specificationsa
Item # NLCL1 NLCL2 NLCL3
Crystal Length 10.00 mm 15.00 mm 20.00 mm
Angle of Optic Axis (θ, Φ)b 90°, 11.4°
Application Type-I SHG
AR Coating (AOI = 0°)c R < 0.25% at 1064 nm and 532 nm
Fundamental Wavelength (1ω) 1064 nm
SHG Wavelength (2ω) 532 nm
  • See the Specs tab for complete specifications.
  • Angle Between Crystal's Surface Normal and Optic Axis
  • See the Specs tab for performance graphs.
Implementation Guidelinesa
Item # NLCL1 NLCL2 NLCL3
Recommended Operating Temperature <60 °C
Temperature Stabilityb ±2.6 °C ±1.8 °C ±1.4 °C
Minimum Recommended Focal Spot Size (1/e2 Diameter)c,d 175 µm 260 µm 350 µm
Minimum Recommended Pulse Duration (FWHM)c 0.42 ps 0.65 ps 0.88 ps
Phase Matching Bandwidth (FWHM)c 3.8 nm 2.5 nm 1.9 nm
Recommended Oven (Optional)e NLCH1(/M) or NLCH2(/M) NLCH2(/M)
  • See the Guidelines tab for complete recommendations and theoretical performance data.
  • For SHG, temperature fluctuations greater than these will result in a ≥10% drop in harmonic generation efficiency.
  • Assumes incident light with a wavelength of 1064 nm.
  • The recommended minimum focal spot size is larger than the Boyd and Kleinman optimum ratio to preserve SHG circularity as determined through numerical analysis. The SHG Output becomes increasingly elliptical below this recommendation.
  • Sold separately below. While an oven for temperature control is not required for operation, it is recommended for SHG output stability. Please see the Guidelines tab for more information.
  • Mounted LBO Crystal with AR Coating for 532 nm and 1064 nm
  • Designed for Type-I SHG with 1064 nm Nanosecond, Picosecond, Nd:YAG, Nd:YLF, and Yb:YAG Lasers
  • Optional Crystal Oven for Temperature Stability Available Below (Sold Separately)

These LBO crystals are designed to produce type-I SHG emission at 532 nm from an input beam with a center wavelength of 1064 nm. They are available with lengths of 10.00, 15.00, or 20.00 mm and feature an AR coating to reduce surface reflections at the fundamental and second harmonic wavelengths. The crystals are mounted in housings that are 21.0 mm wide, 10.8 mm tall, and 11.0 mm (Item # NLCL1), 16.0 mm (Item # NLCL2), or 21.0 mm (Item # NLCL3) long, with a clear aperture of 2.7 mm x 2.7 mm. These mounted crystals can be used to frequency double the output of 1064 nm nanosecond and picosecond lasers such as Item # QSL106B. Please see the SHG and SFG Experimental Setups tab for an example of an SHG experimental setup.

Due to the LBO crystal length, the efficiency of SHG is highly sensitive to temperature and temperature fluctuations (please see the SHG Tutorial tab for more information). At a 0° angle of incidence, these crystals demonstrate peak SHG efficiency at around 20° C. To stabilize the SHG output, Thorlabs recommends using our Ovens for Nonlinear Crystals (sold separately below) for heating and temperature control. Please see the Guidelines tab for more information on the temperature requirements for the NLCL1, NLCL2, and NLCL3 LBO crystals.

The NLCL1, NLCL2, and NLCL3 crystals are optimized for type-I SHG of a 1064 nm input beam. Thorlabs also offers LBO crystals designed for non-critical phase matched SHG of the same wavelength (sold below), which can increase the SHG efficiency for lower power lasers without reducing the beam circularity.

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LBO Crystals for Non-Critical Phase Matched SHG: 1064 nm Fundamental, 532 nm SHG

Key Specificationsa
Item # NLCL8 NLCL9
Crystal Length 20.00 mm 30.00 mm
Angle of Optic Axis (θ, Φ)b 90°, 0°
Application Non-Critical Phase Matched SHG
AR Coating (AOI = 0°)c R < 0.25% at 1064 nm and 532 nm
Fundamental Wavelength (1ω) 1064 nm
SHG Wavelength (2ω) 532 nm
  • See the Specs tab for complete specifications.
  • Angle Between Crystal's Surface Normal and Optic Axis
  • See the Specs tab for performance graphs.
Implementation Guidelinesa
Item # NLCL8 NLCL9
Recommended Operating Temperature 150 °C
Temperature Stabilityb ±1.0 °C ±0.8 °C
Minimum Recommended Focal Spot Size (1/e2 Diameter)c,d 69 µm 85 µm
Minimum Recommended Pulse Duration (FWHM)c 0.88 ps 1.30 ps
Phase Matching Bandwidth (FWHM)c 1.9 nm 1.3 nm
Recommended Ovene NLCH2(/M)
  • See the Guidelines tab for complete recommendations and theoretical performance data.
  • For SHG, temperature fluctuations greater than these will result in a ≥10% drop in harmonic generation efficiency.
  • Assumes incident light with a wavelength of 1064 nm.
  • The recommended minimum focal spot size is determined by the optimal focusing condition for SHG as calculated using the Boyd and Kleinman ratio of L/b = 2.84, where L is the optical path length in the crystal and b is the confocal parameter of the Gaussian beam. For more information, please see G.D. Boyd and D.A. Kleinman, "Parametric Interaction of Focused Gaussian Light Beams," Journal of Applied Physics 39, 3597 - 3639 (1968).
  • Sold separately below. For non-critical phase matching, an oven is required to set and maintain an operating temperature of these crystals at around 150 °C. Please see the Guidelines tab for more information.
  • Mounted LBO Crystal with AR Coating for 532 nm and 1064 nm
  • Designed for NCPM SHG with 1064 nm Nanosecond, Picosecond, Nd:YAG, Nd:YLF, and Yb:YAG Lasers
  • Crystal Oven Required for Phase Matching (Sold Separately Below)

These LBO crystals are designed to produce NCPM SHG emission at 532 nm from an input beam with a center wavelength of 1064 nm. They are available with lengths of 20.00 or 30.00 mm and feature an AR coating to reduce surface reflections at the fundamental and second harmonic wavelengths. The crystals are mounted in housings that are 21.0 mm wide, 10.8 mm tall, and 21.0 mm (Item # NLCL8) or 31.0 mm (Item # NLCL9) long, with a clear aperture of 2.7 mm x 2.7 mm. These mounted crystals can be used to frequency double the output of 1064 nm nanosecond and picosecond lasers such as Item # QSL106B. Please see the SHG and SFG Experimental Setups tab for an example of an SHG experimental setup.

The NLCL8 and NLCL9 NCPM SHG crystals have a larger angular acceptance bandwidth compared to our type-I SHG crystals sold above. This allows for tighter focusing without reduction in circularity and increased SHG conversion efficiency with increased illumination intensity. Instead of angle tuning, non-critical phase matching is accomplished by tuning the temperature of the crystal. For a pump wavelength of 1064 nm, a crystal temperature of 150 °C is required for phase matching. For temperature control, Thorlabs recommends our NLCH2(/M) ovens for nonlinear crystals (sold separately below), which are specifically designed to hold these LBO crystals and provide high temperature stability. Please see the Guidelines tab for more information on the temperature requirements for the NLCL8 and NLCL9 LBO crystals.

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LBO Crystals for Type-II SFG: 1064 nm + 532 nm Fundamental, 355 nm SFG

Key Specificationsa
Item # NLCL6 NLCL7
Crystal Length 10.00 mm 15.00 mm
Angle of Optic Axis (θ, Φ)b 42.4°, 90°
Application Type-II SFG
AR Coating (AOI = 0°)c R < 0.5% at 1064 nm, 532 nm, and 355 nm
Fundamental Wavelengths (1ω + 2ω) 1064 nm + 532 nm
SFG Wavelength (3ω) 355 nm
  • See the Specs tab for complete specifications.
  • Angle Between Crystal's Surface Normal and Optic Axis
  • See the Specs tab for performance graphs.
Implementation Guidelinesa
Item # NLCL6 NLCL7
Recommended Operating Temperature <60 °C
Temperature Stabilityb ±1.4 °C ±1.0 °C
Minimum Recommended Focal Spot Size (1/e2 Diameter)c,d 221 µm 330 µm
Minimum Recommended Pulse Duration (FWHM)c 2.05 ps 3.10 ps
Phase Matching Bandwidth (FWHM)c 0.8 nm 0.5 nm
Recommended Ovene NLCH1(/M) or NLCH2(/M)
  • See the Guidelines tab for complete recommendations and theoretical performance data.
  • For SFG, temperature fluctuations greater than these will result in a ≥10% drop in harmonic generation efficiency.
  • Assumes incident light with a wavelength of 1064 nm. For the 532 nm input, these are the recommendations for the characteristics of the 1064 nm beam incident on one of our SHG crystals that produce the additional 532 nm input beam.
  • The recommended minimum focal spot size is larger than the Boyd and Kleinman optimum ratio to preserve SHG circularity as determined through numerical analysis. The SHG Output becomes increasingly elliptical below this recommendation. The recommended minimum focal spot sizes for the 532 nm input light are 1/√2 times the recommended spot sizes at 1064 nm. This spot size will naturally result from the matched confocal parameter in the SHG from a crystal producing the 532 nm input, meaning that the beams do not need to be separated before entering the SFG crystal, as shown in Figure 4.2 in the SHG and SFG Experimental Setups tab. For more information, please see G.D. Boyd and D.A. Kleinman, "Parametric Interaction of Focused Gaussian Light Beams," Journal of Applied Physics 39, 3597 - 3639 (1968).
  • Sold separately below. While an oven for temperature control is not required for operation, it is recommended for SFG output stability. Please see the Guidelines tab for more information.
  • Mounted LBO Crystal with AR Coating for 355 nm, 532 nm, and 1064 nm
  • Designed for Type-II SFG with 1064 nm Nanosecond, Picosecond, Nd:YAG, Nd:YLF, and Yb:YAG Lasers in Combination with the Type-I or NCPM SHG Crystals Above
    • No Need to Reorient Polarizations of the 1064 and 532 nm Beams
  • Optional Crystal Oven for Temperature Stability Available Below (Sold Separately)

These LBO crystals are designed to produce third harmonic emission at 355 nm from type-II SFG of 1064 nm and its second harmonic 532 nm. They are available with lengths of 10.00 or 15.00 mm and feature an AR coating to reduce surface reflections at the fundamental, second harmonic, and sum frequency wavelengths. The crystals are mounted in housings that are 21.0 mm wide, 10.8 mm tall, and 11.0 mm (Item # NLCL6) or 16.0 mm (Item # NLCL7) long, with a clear aperture of 2.7 mm x 2.7 mm. When paired with one of the SHG crystals above, these mounted crystals can be used to generate 355 nm sum frequency photons from the output and second harmonic of 1064 nm nanosecond and picosecond lasers such as Item # QSL106B. Please see the SHG and SFG Experimental Setups tab for an example of an SFG experimental setup.

Due to the LBO crystal length, the efficiency of SFG is highly sensitive to temperature and temperature fluctuations (please see the SHG Tutorial tab for more information). At a 0° angle of incidence, these crystals demonstrate peak SHG efficiency at around 20° C. To stabilize the SFG output, Thorlabs recommends using our Ovens for Nonlinear Crystals (sold separately below) for heating and temperature control. Please see the Guidelines tab for more information on the temperature requirements for the NLCL6 and NLCL7 LBO crystals.

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Ovens for Nonlinear Crystals

Specifications
Item # NLCH1(/M) NLCH2(/M)
Crystal Length Up to 15.00 mma Up to 30.00 mma,b
Max Operating Temperature 200 °C
Clear Aperture Ø0.18" (4.6 mm)c
Beam Height 1.00" (25.4 mm)
Operating Voltage 24 V
Electrical Connection 6-Pin Female Hirosed
Dimensions (H x W x D) 1.87" x 2.51" x 1.95"
(47.4 mm x 63.8 mm x 49.5 mm)
1.87" x 2.51" x 2.50"
(47.4 mm x 63.8 mm x 63.5 mm)
Weight 0.22 kg 0.27 kg
Recommended Controllere TC300B
  • Compatible with Item #s NLCL4, NLCL1, NLCL2, NLCL6, and NLCL7
  • Compatible with Item #s NLCL5, NLCL3, NLCL8, and NLCL9
  • When the SM05-Threaded (0.535"-40) plug is removed, the aperture is Ø1/2".
  • Compatible with Item # HR10CAB1 (Included) and Item # HR10AD1
  • Sold Separately Below
  • Heating from Ambient Temperature to 200 °C
  • Compatible with Nonlinear LBO Crystals Above
  • Options Available for Crystals up to 30.00 mm Long
  • Requires a Temperature Controller Such as our TC300B Temperature Controller (Sold Separately Below)
NLCH1 Oven Cover and Screws
Click to Enlarge

Figure G5.1  Four screws on the top of the oven can be removed to open the cover and access the heater deck.
NLCH1 Interior Screws
Click to Enlarge

Figure G5.2  Two interior screws can be removed to mount a nonlinear crystal in the ovens.

The NLCLH1(/M) and NLCLH2(/M) Ovens for Nonlinear Crystals are designed to provide temperature control and stability for the nonlinear LBO crystals sold above. Our LBO crystals with lengths up to 15.00 mm can be mounted in either oven while those with lengths from 20.00 to 30.00 mm can only be mounted in the NLCH2(/M) oven. To mount one of our LBO crystals, first remove the cover of the oven via the four M2.5 x 0.45 cap screws shown in Figure G5.1 and the two interior screws shown in Figure G5.2. Then place the crystal in the oven, aligning it with the two Ø2.0 mm dowel pins inside the oven. Finally, secure the crystal using the two cap screws previously removed from the oven's interior.

Each oven features four 4-40 threaded holes on the front and back faces, providing compatibility with our 30 mm Cage Systems for easy incorporation into an optical path. The ovens can be mounted directly to our PY005(/M) 5-Axis Stage via two of the Ø0.13" (3.2 mm) dowel pin holes on the bottom side of the oven (dowel pins not included) and the #8 (M4) central counterbore on the stage. The ovens require a temperature controller, such as our TC300B temperature controller (sold below) and can be connected to the controller using the included 6-pin Hirose cable. For more information on our nonlinear crystal ovens, please see the full web presentation.

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Heater Temperature Controller

Key Specificationsa
Output Power per Channel 48 W (Max)
Output Current per Channel 2 A (Max)
Output Voltage per Channel 24 V (Max)
Temperature Setting Range -200 to 400 °Cb
Set Point Resolution 0.1 °C / 0.001 °Cc
Temperature Stability ±0.1 °C
Output Connector Type Hirose HR10A-7R-6S(73)
USB Interface USB 2.0 Type-B
Power Supply 100 - 240 VAC, 50 - 60 Hz, 165 VA Max
Operating Temperature 0 - 40 °C
Storage Temperature -15 - 65 °C
Dimensions (H x W x D) 86.6 mm x 154.3 mm x 327.8 mm
(3.41” x 6.07” x 12.91”)
Weight 1.7 kg
  • See the full web presentation for complete specifications.
  • Sensor Dependent
  • 0.001 °C Resolution Only In High Resolution Mode; Requires NTC Thermistor
  • Control Temperature from -200 °C to 400 °C
  • Run Standalone or via Software
  • Programmable PID with Auto-Tuning Functionality

The TC300B Heater and Thermoelectric Cooler (TEC) Temperature Controller is a two-channel benchtop controller intended for use with resistive heating elements and thermoelectric cooler devices rated up to 48 W. It can be used to provide temperature control from ambient to 200 °C for the nonlinear crystal ovens above. User-programmable maximum temperature and current/voltage limits protect the connected heating element from being overheated or over driven. Other safety features include an Open Sensor Alarm that will shut down the driver if the temperature sensing element is missing or becomes disconnected.

Capable of standalone operation from a simple keypad interface, this controller can also be connected to and controlled from a PC using the included USB Type-B cable and our TC300B Software, LabVIEW®* drivers, LabWindows drivers, or a simple command-line interface from any terminal window.

See the full web presentation for more information on the features of the TC300B controller.

*LabVIEW® is a registered trademark of National Instruments Corporation.

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